Co-authors: Dong-Ru Hsieh, Yi-Hsiu Chen, Yi-Sin Rao, Li-Quan Yang, Chia-Chen Wan, Kuan-Lin Chen, Shang-Lin Hsieh, Li-Ting Chou,
Yi-Chen Chiang, Nai-Fang Hsu, Chun-Jung Su and Tien-Sheng Chao
National Yang Ming Chiao Tung University
• T3-1 Suppression of Bias Instability in Monolayer WSe2 Top-Gate pFETs at Sub-1 nm EOT
Co-authors: Chen-Hsun Hsu1, Yu-Wei Hsu1,2, Ching-Shuan Huang1, Nien-En Chiang2, Yu-Tung Lin2, Shao-Heng Chen2, Ting-Hua Wei1, Sin-Yue Li1, Ying-Zhang Chiu2, I-Chih Ni2, Chih-I Wu2 and Tsung-En Lee1
1 National Yang Ming Chiao Tung University
2 National Taiwan University
• T5-1 High-RA STT-MRAM for In-Memory Computing: From Device Engineering to Prototype-IMC ValidationCo-authors: Ming-Chun Hong1, Hsin-Han Lee2, Guan-Long Chen2, Sin-You Huang2, Chiao-Yun Lo2, Yi-Hui Su2, Ho-Lin Tsai2,
Shih-Ching Chiu2, Cheng-Yi Shih2, Yao-Jen Chang2, Chih-Yao Wang2, Shan-Yi Yang2, Yu-Chen Hsin2, Jeng-Hua Wei2,
Shyh-Shyuan Sheu2, Wei-Chung Lo2, Shih-Chieh Chang2 and Tuo-Hung Hou1
1 National Yang Ming Chiao Tung University
2 Industrial Technology Research Institute
• T5-2 A Novel Gate-injected Ferroelectric Tunnel FET with Ambipolarity Enabling 3D In-Storage Computing and Searching for LLMs
Co-authors: Jin Luo, Shaodi Xu, Yuxin Lin, Qianqian Huang and Ru Huang
Peking University
• T5-3 Novel Full Ferroelectric-based Continuous-Time Ising Machine with Ultra-Low Hardware Cost for Real-Time Combinatorial Optimization
Co-authors: Weikai Xu, Qianqian Huang and Ru Huang
Peking University
• T7-1 Performance Enhancement of Nanosheet/Nanowire RF Transistor Arrays by Backside Metal Layout
Co-authors: Chih-Hsuan Lu, Hsin-Cheng Lin, Tao Chou, Ching-Wang Yao and C. W. Liu
National Taiwan University
• T9-1 Cryogenic Reliability Physics of 28nm HKMG nMOSFETs: Insights from A ΔDIBL Model and Gated-Diode Measurement
Co-authors: Pin-Jie Pu1, Jia Zhe Ao2 and E Ray Hsieh3
1 National Central University
2 National Tsing Hua University
3 National Yang Ming Chiao Tung University
• T12-1 A High-Endurance 28nm HKMG Bipolar 2T eRRAM Fabricated Without Extra Masks: Insight into Filament Evolution via RTN Measurement
Co-authors: Yi Xiang Huang1, Yu Hsien Lin1 and E Ray Hsieh2
1 National Central University
2 National Yang Ming Chiao Tung University