Best Paper Award
Starting 2009, an Award Committee is formed for the selection of the Best Paper Award each year. The selection criteria of the award include the technical contents and writing quality of the paper as well as the quality of the presentation at the symposium. The award will be presented to the selected paper in the following year's symposium.
2020 VLSI-DAT Best Paper Award Committee
Led by the Technical Program Committee co-chairs, Prof. Atsushi Takahashia and Prof. Tsung-Hsien Lin, the award committee members consist of subcommittee chairs and co-chairs. The Award Committee will select the 2020 Best Paper Award based on the criteria including the technical contents and depth, quality of the paper as well as the quality of the presentation.The award will be announced after the conference and granted in the VLSI-TSA and DAT Opening ceremony in 2021. The winner will be rewarded by a certificate and US$500 . Besides, it will also offer the registration fee waived of 2021 VLSI-DAT.
2019 Award Winners Congratulations !
The 2019 Best Paper Award will be granted in the VLSI-DAT Opening ceremony in 2020 and the winner will be rewarded by a certificate and US$500 . Besides, it will also offer the registration fee waived of 2020 VLSI-DAT.
• A Power-efficient, Bi-directional Readout Interface Circuit for Cyclic-voltammetry
Co-authors: Yi-Chia Chen, Shao-Yung Lu, Jui-Hsiang Tsai and Yu-Te Liao
National Chiao Tung University
• Primitive Concept Identification In A Given Set Of Wafer Maps
Co-authors: Ahmed Wahba1, Chuanhe Shan1, Li-C. Wang1 and Nik Sumikawa2