Monday, April 25, 1:30 PM~3:15 PM Ballroom B ( 10F )
D3 Special Session _ Big Data and Cloud_Storage

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    1:30 PM~2:05 PM
    D3-1 Non-Volatile Memory versus Big Data
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    2:05 PM~2:40 PM
    D3-2 Storage Consideration for Big Data in the Cloud
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    2:40 PM~3:15 PM
    D3-3 SDA: software-defined accelerator for large-scale deep learning system

Monday, April 25, 3:35 PM~5:20 PM Ballroom B ( 10F )
D4 Special Session_ Big Data and Cloud_Computing

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    3:35 PM~4:10 PM
    D4-1 Unsupervised Hierarchical Clustering Based on Sequential Partitioning and Merging
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    4:10 PM~4:45 PM
    D4-2 Big Data Analytics to Empower Manufacturing Intelligence and Smart Production for Industry 3.5
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    4:45 PM~5:20 PM
    D4-3 Innovations such as Autonomous Driving Demand New Methods and Tools in Systems Engineering

Tuesday, April 26, 1:30 PM~4:45 PM Ballroom B ( 10 F )
J3 Joint Special Session _ 5G / IoT

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    1:30 PM~2:05 PM
    J3-1 Trend, Technology & Architecture of Small Cell in 5G Era
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    2:05 PM~2:40 PM
    J3-2 Doherty Technique for 5G RF and mm-wave Power Amplifiers
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    2:40 PM~3:15 PM
    J3-3 Mixed Analog-Digital Pulse-Width Modulator for Massive-MIMO Transmitters
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    3:35 PM~4:10 PM
    J3-4 Ultra-low Power SoC for Wearable & IoT
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    4:10 PM~4:45 PM
    J3-5 5G and IoT

Wednesday, April 27, 10:20 AM~11:20 AM Ballroom A ( 10F )
D14 Industrial Session_ Advanced VLSI System Design Techniques

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    10:20 AM~10:40 AM
    D14-1 MiraVision™ SmartScreen—MediaTek’s Approach to Power Saving for Displays
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    10:40 AM~11:00 AM
    D14-2 Electrical / Thermal Co-Design and Co-Simulation, from Chip, Package, Board to System
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    11:00 AM~11:20 AM
    D14-3 ARM Platform for Performance and Power Efficiency --- Hardware and Software Perspective

Wednesday, April 27, 11:30 AM~12:30 PM Ballroom A ( 10F )
D17 Industrial Session_ Advanced Electronics Design Automation Techniques

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    11:30 AM~11:50 AM
    D17-1 Single Layer Differential Group Routing for Flip-Chip Designs
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    11:50 AM~12:10 PM
    D17-2 Automatic Mixed-Signal Behavioral Model Generation Environment
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    12:10 PM~12:30 PM
    D17-3 Data Analytics to Aid Detection of Marginal Defects in System-Level Test

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